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MS7050 Digital Test System
详细说明

Key Feature

                •    All-in-one design,11 Slots Per System

                •    Max256 CH Digital Pin Per System

                •    Max 96 CH Analog Pin Per System

                •    50MHz Clock,33MHz Digital Data Rate

                •    8Meg Vector Depth,4K Fail Memory

                •    Per-pin Drive Levels, -1to +7V

                •    Per-pin Compare Levels, -1 to +7V

                •    Per-pin Active Load, +/-24mA

                •    Per-pin Pmu,-2 to +10V,+/-32mA

                •    8 CH DOMU,-2 to +10V,+/-256mA

                •    Per-pin Selectable TMU,-2 to +8V,50MHz

                •    64 bit Relay Drive Per System

                •    Utility Power Supply  +5V, +15V, -15V

                •    Max 128 Sites Parallel Test 

                •    Pattern Code Compatible With J750